Reliability analysis of high-lift device wear based on indicator error control KrigingYunwen FENG, Sirui ZHOU, Xiaofeng XUE, Junyu CHEN, Jinfan CAO, Xianmin CHEN and Jianbing GEJNWPU, 44 2 (2026) 213-221DOI: https://doi.org/10.1051/jnwpu/20264420213
